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Secondary ion mass spectrometry : basic concepts, instrumental aspects,applications and trends.

By: Benninghoven, A.
Contributor(s): Werner, H.W | Rudenauer, F.G.
Material type: TextTextPublisher: New York : John Wiley , 1987Description: xxxv,1127 p. ; 24 cm.ISBN: 0471101561.Subject(s): Analytical ChemistryDDC classification: 543.0873
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Item type Current location Collection Call number Copy number Status Date due Barcode Item holds
Lending Materials Lending Materials Main Library
Lending Division 		Lending Collection 543.0873 BEN (Browse shelf) 1 Available 193941
Total holds: 0

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